Measurement of pavement unevenness
US7748264B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 5, 2006 |
| Grant date | Jul 6, 2010 |
| Priority date | — |
| Expiry date | Jun 24, 2027 |
Classification
- Technology area (CPC E)Fixed Constructions
- CPC primaryE01C23/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Measuring the unevenness of a pavement surface. A frame carrying an array of sensors is transported above the pavement surface. At a first position, the distance of each sensor is measured from respective first points on the pavement surface. The measurements are repeated for subsequent positions. Calculations from the measurements determine any change in tilt. The measurements and calculations are used to derive a measure of the unevenness of the pavement surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.