Circuit for distributing a test signal applied to a pad of an electronic device

US7750656B2 · kind B2 · utility

Assignee

• STMicroelectronics SA

Inventors

• Nicola Del Gatto · Cassina de' Pecchi, IT
• Antonio Geraci · Monza, IT
• Marco Sforzin · Cernusco sul Naviglio, IT
• Nicola Rosito · Corato, IT

Key dates

• Filing date: Feb 8, 2006
• Grant date: Jul 6, 2010
• Expiry date: Jun 25, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31723
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The circuit distributes a test signal applied to a pad of an electronic device that is enabled during test phases of the device and disabled during normal functioning. The circuit includes a “master” buffer, one or more “slave” buffers, one for each replicated pad, and an interconnection bus of the “master” and “slave” buffers. During a test phase, the “master” buffer replicates on the interconnection bus the test signal fed to a pad of the device, while the “slave” buffers convey to the various replica pads of the feed pad the signal present on the interconnection bus. During the normal operation of the device, the circuit remains disabled.