Guided wave pipeline inspection system with enhanced focusing capability
US7751989B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 30, 2007 |
| Grant date | Jul 6, 2010 |
| Priority date | — |
| Expiry date | Jun 20, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2113/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for inspecting a pipeline having at least two transducers divided into segments, the segments each containing a number of sensors, wherein a maximum number of segments is equal to a number of transducers, an arrangement configured to send, receive and store signals, wherein the arrangement has a number of pulser channels and a number of receiver channels, wherein the arrangement has at least one multiplexing arrangement for multiplexing signals from the arrangement; and a time delay arrangement connected to the arrangement configured to send, receive and store signals. The system may also provide for focal point skewing, near real time coating compensation for proper excitation mode, adjusted time delay capability and the ability to focus beyond changes in geometry.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.