High-frequency measuring system having spatially separated high-frequency modules
US7756516B2 · kind B2 · utility
2Cited by
6References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 27, 2004 |
| Grant date | Jul 13, 2010 |
| Priority date | — |
| Expiry date | May 27, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A high-frequency measuring system is provided for measuring a test device with a measuring device unit and at least one high-frequency module connected to the measuring device unit. Each high-frequency module is located spatially separated from the measuring device unit and is connected to the measuring device unit via a digital interface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.