Computation of sensitivity for resistivity measurements
US7756641B2 · kind B2 · utility
5Cited by
3References
8Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 20, 2004 |
| Grant date | Jul 13, 2010 |
| Priority date | — |
| Expiry date | Mar 26, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides methods and systems for numerically computing tool response sensitivities of subterranean measurement tools such as resistivity logging tools. The methods and systems enable much faster computation of sensitivities than previously available for resistivity tools. For typical tools that apply dozens or hundreds of parameters, the methods of the present invention may reduce sensitivities computation time by a factor substantially equal to the number of parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.