Self-calibration systems and methods
US7756663B2 · kind B2 · utility
3Cited by
5References
3Claims
0Family size
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Key dates
| Filing date | Jun 27, 2006 |
| Grant date | Jul 13, 2010 |
| Priority date | — |
| Expiry date | Nov 8, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/21
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Various embodiments of self-calibration systems and methods are described. One method embodiment, among others, includes imposing an alternate test to components within the device, responsive to the imposition of the alternate test, providing test responses corresponding to the components, and substantially, simultaneously mapping each of the test responses to corresponding specification values of the components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.