Measuring device for measuring aspects of objects
US7756673B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 28, 2007 |
| Grant date | Jul 13, 2010 |
| Priority date | — |
| Expiry date | Aug 4, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/44
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An exemplary measuring device (100) for measuring aspects of objects includes a first contour measuring probe (10), a second contour measuring probe (20) and a processor (30). The first contour measuring probe (10) has a first tip extension (16) and a first displacement sensor (19). The first tip extension (16) is slidable in a first direction. The first displacement sensor (19) is used to sense a displacement of the first tip extension (16). The second contour measuring probe (20) has a second tip extension (26) and a second displacement sensor. The second tip extension (26) is slidable in the first direction. The second displacement sensor is used to sense a displacement of the second tip extension (26). The processor (30) is electrically connected to the first displacement sensor (19) and the second displacement sensor respectively.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.