Testing system for flip-type electronic device

US7757566B2 · kind B2 · utility

Assignees

• SHENZHEN FUTAIHONG PRECISION INDUSTRY CO., LTD. · CN
• FIH (HONG KONG) LIMITED · CN

Inventors

• Lei Li · Zhengzhou, CN
• Ping Chen · Nanhu, CN
• Zhi Cheng · Weifang, CN
• Xue-Liang Zhai · Nanhu, CN
• Ming Li · Beijing, CN
• Chang-Fa Sun · Nanhu, CN
• Dong Li · Beijing, CN
• YONG-ZHI TAO · Nanhu, CN

Key dates

• Filing date: Oct 1, 2007
• Grant date: Jul 20, 2010
• Expiry date: Sep 18, 2028

Classification

• Technology area (CPC G): Physics
• CPC primary: G01M99/005
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A testing system (100) is used to test a flip-type electronic device (80). The electronic device includes a cover (802) and a main body (801). A hinge (803) connects with the cover and the main body. The testing system includes a base (10), a plummer (20), a flipping device (30) and a control device (40). The plummer is fixed on the base for locking the electronic device. The flipping device is fixed on the base for opening and closing the cover of the electronic device. The control device includes an optical fiber sensor (42) for sensing the movement of the cover of the electronic device. The control device connects with the flipping device so as to control the flipping device.