Patent · US Active

Method for manufacturing a patterned structure

US7759609B2 · kind B2 · utility

5Cited by
31References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 4, 2004
Grant dateJul 20, 2010
Priority date
Expiry dateNov 19, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K3/048
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for forming a micro- or nano-pattern of a material on a substrate is presented. The method utilizes a buffer layer assisted laser patterning (BLALP). A layered structure is formed on the substrate, this layered structure being in the form of spaced-apart regions of the substrate defined by the pattern to be formed, each region including a weakly physisorbed buffer layer and a layer of the material to be patterned on top of the buffer layer. A thermal process is then applied to the layered structure to remove the remaining buffer layer in said regions, and thus form a stable pattern of said material on the substrate resulting from the buffer layer assisted laser patterning. The method may utilize either positive or negative lithography. The patterning may be implemented using irradiation with a single uniform laser pulse via a standard mask used for optical lithography.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.