Sample for measuring alignment axis for liquid crystal display, method of manufacturing sample, and method of measuring alignment axis
US7760300B2 · kind B2 · utility
2Cited by
6References
7Claims
0Family size
Assignee
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Key dates
| Filing date | Jun 28, 2007 |
| Grant date | Jul 20, 2010 |
| Priority date | — |
| Expiry date | Mar 28, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F2203/69
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A sample for measuring an alignment axis for a liquid crystal display, a method of manufacturing the sample, and a method of measuring an alignment axis are disclosed. The sample includes a first substrate, a first alignment layer positioned on the first substrate, and a second alignment layer. The second alignment layer is positioned on the first alignment layer, and has an anisotropy more than an anisotropy of the first alignment layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.