Method for scattered radiation correction

US7760855B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Ernst-Peter Rührnschopf · Erlangen, DE
• Philipp Bernhardt · Forchheim, DE

Key dates

• Filing date: Sep 28, 2007
• Grant date: Jul 20, 2010
• Expiry date: Apr 16, 2028

Classification

• Technology area (CPC A): Human Necessities
• CPC primary: A61B6/4291
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

For scattered radiation correction in dual X-ray absorptiometry it is proposed to use the additional information supplied by the attenuation images in different energy ranges in a correction image area with homogeneous attenuation coefficients in order to determine the respective scattered radiation fraction. Toward that end, the inverse of the primary radiation function is considered and a search conducted for that scatter-to-primary ratio which leads to consistent mass per unit areas for the attenuation images recorded in different energy ranges.