System for testing smart cards and method for same
US7765080B2 · kind B2 · utility
7Cited by
5References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 19, 2006 |
| Grant date | Jul 27, 2010 |
| Priority date | — |
| Expiry date | Jul 9, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K7/0095
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for testing multiple smart card devices in parallel and asynchronously are provided. The system includes a smart card module that may be easily inserted in a digital test system. The smart card module includes multiple smart card instrument channels, each one of which testing a separate smart card device independently and asynchronously from the others. The smart card instrument channels employ a novel modulation technique based on palette waveforms that are formed of transitions between two data bits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.