Patent · US Expired

Depth measurement and depth control or automatic depth control for a hollow to be produced by a laser processing device

US7767928B2 · kind B2 · utility

0Cited by
44References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 8, 2004
Grant dateAug 3, 2010
Priority date
Expiry dateSep 8, 2024

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB23K26/361
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

According to a method for a depth measurement the depths of measuring points on a calibration surface are measured and correction values depending on differences between the measured values and known values are used and stored for a later correction. According to a method for the layer-wise production of a hollow the horizontal boundaries (xg, yg) for the removal of a layer (Si+1) depending on the hollow depth (z) were determined from the shape definition of the hollow. The measured values can be continuously stored and used for a later control of the laser processing device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.