Automatic test equipment capable of high speed test
US7772828B2 · kind B2 · utility
10Cited by
2References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2008 |
| Grant date | Aug 10, 2010 |
| Priority date | — |
| Expiry date | Oct 25, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/56012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Automatic test equipment is capable of performing a high-speed test of semiconductor devices, with a low cost and high efficiency. The automatic test equipment (ATE) comprises: an ATE body configured to electrically test semiconductor devices; a field programmable gate array (FPGA) controlling drivers and comparators on the ATE; an accelerator connected to an output terminal of the FPGA and that doubles an operating frequency of the FPGA; and a decelerator connected to an output terminal of the FPGA and that converts an operating frequency of data transferred from the semiconductor device to the operating frequency of the FPGA.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.