Contact probe with reduced voltage drop and heat generation
US7772864B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 17, 2007 |
| Grant date | Aug 10, 2010 |
| Priority date | — |
| Expiry date | Aug 17, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07314
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contact probe includes a plurality of probes, each of the probes including: an conductive tube; an conductive plunger, contained in at least one end side of the tube, and having a distal end part protruding outward from the tube in an axial direction of the tube; and a coil spring, contained in the tube, and adapted to elastically urge the plunger outward. The plural probes are arranged in a first direction in a socket comprised of insulating material. A cross section of the tube in a direction perpendicular to the axial direction of the tube has a greater size in a direction different from the first direction than a size in the first direction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.