Patent · US Active

Single event transient mitigation and measurement in integrated circuits

US7772874B2 · kind B2 · utility

10Cited by

2References

23Claims

0Family size

Assignee

Actel Corporation · US

Inventors

Sana Rezgui · San Francisco, US
John McCollum · Saratoga, US
Jih-Jong Wang · San Jose, US

Key dates

Filing date	Jan 12, 2009
Grant date	Aug 10, 2010
Priority date	—
Expiry date	Jan 12, 2029

Classification

Technology area (CPC H)Electricity
CPC primaryH03K19/177
WIPO fieldBasic communication processes
WIPO sectorElectrical engineering

Abstract

A method for single event transient filtering in an integrated circuit device is described. The device comprises three sequential elements, each having a data input and a data output with each of the three data outputs coupled to one of three inputs of a voting gate. The method comprises generating first and second nominally equivalent logic signals in first and second SET domains, converting the first and second nominally equivalent logic signals into first, second and third nominally equivalent data channels, and transmitting the first, second and third nominally equivalent data channels to the data inputs of the first, second and third sequential elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.