Image scanner feature detection
US7773270B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 7, 2004 |
| Grant date | Aug 10, 2010 |
| Priority date | — |
| Expiry date | Jun 11, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N1/4097
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Systems are disclosed for detecting an unwanted artifact in an image scanner. An exemplary system includes a treated component of the image scanner, the treated component treated such that light reflects differently from the treated component than light reflected by an image being scanned by the image scanner. The light reflected from the treated component facilitates detection and removal of the unwanted artifact in the image being scanned, the unwanted artifact caused by the light reflected by the treated component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.