Dynamic test pattern composition for image-analysis based automatic machine diagnostics
US7773774B2 · kind B2 · utility
13Cited by
21References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 28, 2004 |
| Grant date | Aug 10, 2010 |
| Priority date | — |
| Expiry date | Jun 10, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N1/00087
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention is directed to a system and method for test target selection in conjunction with dynamic test pattern generation. In the invention, a test pattern page(s) is composed using an optimal set of test targets, which can be accommodated or adjusted to fit within size constraints of the test pattern. The method of the present invention makes use of layout optimization to ensure that related and optimized test targets are accommodated on a single test pattern. For example, it may be preferable to “squeeze in” a smaller-than-normal uniform area target, rather than not to print it at all during a test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.