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US7774347B2 · kind B2 · utility

1Cited by
32References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 30, 2007
Grant dateAug 10, 2010
Priority date
Expiry dateAug 7, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F16/3341
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Determining intersection points of parameter patterns. Parameter patterns are specified in a query. A method includes identifying a first parameter pattern from the query as occurring less often in the index than one other parameter pattern in the query. The data store is searched until a present location of the data store has been identified as including the first parameter pattern. Then the data store is searched for a location of another parameter pattern. If the present location is identified as including the another parameter pattern, then an indication is provided identifying an intersection. Otherwise, the method includes continuing searching remaining portions of the data store to find a location of the another parameter pattern at a new present location. At least one of the acts of searching above includes eliminating at least a portion of records of the data store from searching without being searched prior to being eliminated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.