Patent · US Active

Apparatus for testing a phrase-locked loop in a boundary scan enabled device

US7774665B2 · kind B2 · utility

0Cited by

129References

4Claims

0Family size

Assignee

Actel Corporation · US

Inventors

Wei-Min Kuo · San Jose, US
Donald Y. Yu · Fremont, US

Key dates

Filing date	Aug 26, 2008
Grant date	Aug 10, 2010
Priority date	—
Expiry date	Dec 4, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/3016
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An apparatus for interfacing a phase locked loop in a field programmable gate array. The apparatus comprising a phase locked loop cluster. The phase locked loop further comprising a plurality of RT modules, a plurality of RO modules, at least one TY module, a plurality of receiver modules and at least one buffer module. A phase locked loop selectively coupled to the RT modules, the RO modules, the TY modules, the receiver modules and at least one buffer module in the phase locked loop cluster.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.