Product inspection system and a method for implementing same
US7777209B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Aug 12, 2006 |
| Grant date | Aug 17, 2010 |
| Priority date | — |
| Expiry date | Aug 12, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/952
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system and a method for measuring physical characteristics of a component using the inspection system is provided, wherein the inspection system includes a light source, a sensing device, a reflecting device, and a retention mount, at least one of which is movably associated with the inspection system. The method includes associating a component with the inspection system, operating the inspection system to cause the light source to emit a collimated light beam propagating along a source optical path, reflecting the collimated light beam via the reflecting device to cause a reflected collimated light beam to be incident upon the component to produce a component silhouette which is incident upon the sensing device, generating image data responsive to the component silhouette and processing the image data to generate resultant data comprising at least one of a plurality of physical characteristics of the component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.