Method and system for tracking scattering parameter test system calibration
US7777497B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 17, 2008 |
| Grant date | Aug 17, 2010 |
| Priority date | — |
| Expiry date | Apr 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments describe methods of correcting S-parameter measurements for a DUT. The method includes coupling at least one tracking module associated with a set of electrical standards to a S-parameter measurement device to form a test system. An initial calibration for the test system is then determined. This may include measuring the S-parameters of the electrical standards, generating a calibration along a calibration plane, generating a calibration along a correction plane and determining at least one error adapter from the calibrations. The DUT is coupled to the test system and the S-parameters of the DUT are measured. Changes in the initial calibration are tracked using the tracking modules. Tracking may include measuring the S-parameters of the electrical standards, generating a correction plane calibration and generating a corrected calibration plane calibration from the correction plane calibration and the error adapter(s). The measured S-parameters are corrected using the tracked changes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.