Automated self test for a thermal processing system
US7778799B2 · kind B2 · utility
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35References
22Claims
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Key dates
| Filing date | Jan 2, 2007 |
| Grant date | Aug 17, 2010 |
| Priority date | — |
| Expiry date | Apr 18, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/45154
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
Described are computer-based methods and apparatuses for automated self test for a thermal processing system. A signal to execute the automated self test is received. The automated self test is executed. The execution includes executing one or more self test instructions for the one or more subsystems of the system. Data can be received from sensors associated with the subsystems. The data can be analyzed to determine the results of the automated self test for the thermal processing system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.