Generating self-checking test cases from reduced case analysis graphs
US7779374B1 · kind B1 · utility
12Cited by
24References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 21, 2007 |
| Grant date | Aug 17, 2010 |
| Priority date | — |
| Expiry date | Feb 26, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3684
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system and apparatus for constructing a comprehensive test plan using a case analysis graph is provided. Embodiments of the present invention further provide for automatically generating test cases from a case analysis graph and for measuring functional coverage of the test cases. Additional embodiments of the present invention provide for visualizing both the comprehensive test plan and functional coverage data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.