Patent · US Active

Analyzing mass spectral data

US7781729B2 · kind B2 · utility

8Cited by
5References
64Claims
0Family size

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Key dates

Filing dateMay 27, 2007
Grant dateAug 24, 2010
Priority date
Expiry dateApr 14, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG16C20/20
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for analyzing data from a mass spectrometer comprising obtaining calibrated continuum spectral data by processing raw spectral data; obtaining library spectral data which has been processed to form calibrated library data; and performing a least squares fit, preferably using matrix operations (equation 1), between the calibrated continuum spectral data and the calibrated library data to determine concentrations of components in a sample which generated the raw spectral data. A mass spectrometer system (FIG. 1) that operates in accordance with the method, a data library of transformed mass spectra, and a method for producing the data library.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.