System and method for target location
US7782247B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 25, 2008 |
| Grant date | Aug 24, 2010 |
| Priority date | — |
| Expiry date | Nov 6, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S13/878
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for method of estimating the position of one or more target nodes based on received reflections of a primary signal. The method includes receiving a primary signal from a transmitter node having a known location at a receiver node having a known location and receiving at least one reflected signal at the receiver node, the reflected signal generated by a reflection of the primary signal by a target node having an unknown location. The method further includes applying a target position algorithm to the primary signal and the at least one reflected signal to generate target location information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.