Identification of integrated circuits using pixel or memory cell characteristics
US7787034B2 · kind B2 · utility
12Cited by
30References
32Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2006 |
| Grant date | Aug 31, 2010 |
| Priority date | — |
| Expiry date | Jun 3, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/68
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Disclosed are various embodiments of methods and corresponding devices for effecting such methods that permit integrated circuits, sensors, chips or dies to be identified. Imperfections or irregularities in pixels or memory cells are used to generate identification codes for integrated circuits, sensors, chips or dies. Addresses or data locations of selected defective pixels or memory cells may be used to generate such identification codes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.