Patent · US Active

Method for planning an examination in a magnetic resonance system

US7787684B2 · kind B2 · utility

2Cited by

27References

9Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Walter Beck · Schwieberdingen, DE
Klaus Mayer · Prien am Chiemsee, DE
Cecile Mohr · Erlangen, DE
Jochen Zeltner · Erlangen, DE

Key dates

Filing date	Aug 3, 2006
Grant date	Aug 31, 2010
Priority date	—
Expiry date	Jul 1, 2029

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S128/92
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In a method for planning an examination of an examination subject in a magnetic resonance system, the planning of the examination ensues based on a composite overview image that is composed of at least two individual images. A first part of the overview image is acquired and the first part of the overview image is made available to operating personnel of the magnetic resonance system for planning further measurements. A second part of the overview image is acquired and the first part and the second part of the overview image are combined. The combined image of the first part and second part of the overview image is made available for planning further measurements. The first part of the overview image is made available to operating personnel no later than before making the overview image available.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.