Patent · US Active

Extrusion detection using taint analysis

US7788235B1 · kind B1 · utility

128Cited by
1References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 29, 2006
Grant dateAug 31, 2010
Priority date
Expiry dateJul 1, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F21/16
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An extrusion detection system prevents the release of sensitive data from an enterprise. The system includes administration module for broadcasting taint instructions, each of which include a definition of sensitive data. The system also includes a plurality of extrusion detection nodes. Each node marks sensitive data as tainted responsive to the taint instructions, marks data that depends on sensitive data as tainted. When the potential release of tainted data is detected, an action is executed responsive to the taint instructions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.