Patent · US Active

Method and device for contacting a surface point on a workpiece

US7788820B2 · kind B2 · utility

2Cited by
8References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 7, 2008
Grant dateSep 7, 2010
Priority date
Expiry dateMar 17, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B21/045
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe head having a probe head base and a stylus is provided for contacting a surface point on a workpiece. The stylus is moveable relative to the probe head base and has a defined rest position relative to the probe head base. For the contacting, the probe head is moved relative to the workpiece until the stylus touches the surface point with a defined contacting force. A correction data record representing a hysteresis behavior of the stylus with respect to the rest position is provided, and the contacting force is determined using the correction data record.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.