Open circuit delay devices, systems, and methods for analyte measurement
US7794658B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 25, 2007 |
| Grant date | Sep 14, 2010 |
| Priority date | — |
| Expiry date | Jan 15, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/3273
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
System, circuits, and methods to reduce or eliminate uncompensated voltage drop between an electrode of an electrochemical cell usable for analyte measurement. In one example, a system is provided that includes a test strip, a reference voltage circuit, an operational amplifier connected to the reference voltage circuit to provide a pre-determined fraction of a reference voltage substantially equal to the test voltage applied to the first line, the operational amplifier having an output configured for one of a connected or disconnected state to the first line, and a processing circuit connected to the output of the operational amplifier and the first line such that, during a disconnected state between the output and the first line, the processing circuit remains in connection with the first line. In another example, a method of measuring an electrochemical reaction of an electrochemical cell is provided that includes applying a test voltage to the first electrode and connecting the second electrode to ground; uncoupling the first electrode from the output of the circuit while allowing electrical communication from the first electrode to the processor; and coupling the first electro…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.