Contact device to contact an electrical test specimen to be tested and a corresponding contact process

US7795888B2 · kind B2 · utility

Assignee

• Feinmetall GmbH · DE

Inventors

• Rainer Schmid · Neckartenzlingen, DE
• Ulrich Gauss · Herrenberg, DE

Key dates

• Filing date: Nov 27, 2007
• Grant date: Sep 14, 2010
• Expiry date: Jan 27, 2028

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/07357
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to a contacting device for contacting an electrical test piece to be tested, in particular a test piece provided with tin-plated contacts, comprising at least two guide elements having openings through which contact elements pass essentially axially and which project from the test piece, on a side of the associated guide element facing the test piece, for contacting the test piece. The invention is characterized in that the axial distance between the guide elements or the axial position of the guide element facing the test piece may be adjusted to fit the projecting length.