Patent · US Active

State-retentive scan latch

US7796445B1 · kind B1 · utility

3Cited by
2References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 12, 2008
Grant dateSep 14, 2010
Priority date
Expiry dateDec 12, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C19/28
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A device can include 1) a sustained or constantly powered low leakage latch to and from which a volatile state is uploaded and downloaded, respectively, based on an active-to-low signal, and 2) an intermittently powered or de-powerable memory element, coupled to the low leakage latch, from which and to which the volatile state is uploaded and downloaded, respectively, based on the active-to-low signal and a de-powerable voltage across the de-powerable memory element is powered and un-powered, respectively.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.