On-chip frequency response measurement
US7797131B2 · kind B2 · utility
2Cited by
42References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 24, 2007 |
| Grant date | Sep 14, 2010 |
| Priority date | — |
| Expiry date | Oct 7, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31725
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and circuit are provided for measuring frequency response performance of an integrated circuit by providing a pulse having a rising edge and a falling edge where the pulse is provided to a plurality of serially connected components. The number of these components which have propagated the leading edge of the pulse before the occurrence of the falling edge provide a numeric indication of the circuit's frequency response and performance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.