Patent · US Active

Metrics to evaluate process objects

US7797136B2 · kind B2 · utility

2Cited by

2References

20Claims

0Family size

Assignee

SAP AG · DE

Inventors

Udo Klein · Maximiliansau, DE
Thomas Wieczorek · Meckesheim, DE
Daniel E. Zimmermann · Peoria, US
Oliver Sievi · Sandhausen, DE
Guenter Pecht-Seibert · Östringen, DE

Key dates

Filing date	Dec 20, 2006
Grant date	Sep 14, 2010
Priority date	—
Expiry date	Apr 23, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG06Q10/0639
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method and system to evaluate process objects for acceptability for use. New metrics that measure both object components and their relationships are used. The method selects metrics for the process objects that measure both the components and their relationships, compares measurements of the selected metrics with corresponding metric norms, and, based on the comparison, determines whether the process objects are acceptable. The system includes a memory to store metrics and process objects and a processor to select applicable metrics for the process objects, calculate the measurements of the selected metrics, compare the measurements to corresponding metric norms, and, based on the comparison, determine whether the process objects are acceptable.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.