Device and method for testing motherboard
US7797581B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 17, 2007 |
| Grant date | Sep 14, 2010 |
| Priority date | — |
| Expiry date | Mar 13, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31705
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing device for testing a motherboard is provided to include a server, a client terminal computer, a debug card and a receiving device. The server is connected to the client terminal computer, for inquiring test results. The debug card is attached to the motherboard, for getting test data. The receiving device connecting with the debug card transmits the test data to the server via a network. A testing method for testing a motherboard is provided to include the following steps: a debug card getting the test data from the motherboard; sending the test data to a receiving device, the receiving device transmitting the test data to a server, the server collating and analyzing the test data; and a client terminal computer inquiring test results via the server.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.