Patent · US Active

Portable metrology device

US7797849B2 · kind B2 · utility

33Cited by
23References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2007
Grant dateSep 21, 2010
Priority date
Expiry dateFeb 6, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B5/14
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Methods and systems for a portable metrology device are described. One embodiment of the present invention is an apparatus including a first link, a first probe coupled with the first link by a first coupling operable to move in a first degree of freedom, a second probe coupled with the first link by a second coupling operable to move in a second degree of freedom, a first sensor operable to output a first sensor signal associated with a motion of the first coupling, and a second sensor operable to output a second sensor signal associated with a motion of the second coupling. The embodiment also includes a processor in communication with the first and second sensors and operable to: receive the first sensor signal and the second sensor signal, and determine a distance between the first probe and the second probe based at least in part on the first sensor signal and the second sensor signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.