Patent · US Active

Testing devices for multihole workpiece

US7798022B2 · kind B2 · utility

0Cited by
3References
16Claims
0Family size

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Inventors

Key dates

Filing dateOct 29, 2007
Grant dateSep 21, 2010
Priority date
Expiry dateJan 1, 2029

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB23Q15/22
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A testing device (100) configured for testing a multihole workpiece (10) with a plurality of holes (12), includes a detecting station (120) and an inspecting box (140). The detecting station positions a plurality of detecting pins (124) and a plurality of detecting apparatus (128). The detecting pins correspond to the holes of the multihole workpiece. The detecting apparatus respond for the multihole workpiece and sending detecting signals. The inspecting box receives the detecting signals from the detecting apparatus of the detecting station, and deals with and shows detecting results.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.