Device for inspecting tangential recesses in a rotor disk
US7800364B2 · kind B2 · utility
3Cited by
6References
6Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | May 7, 2009 |
| Grant date | Sep 21, 2010 |
| Priority date | — |
| Expiry date | May 7, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/904
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection device for inspecting tangential recesses in a rotor disk by means of eddy currents is disclosed. The device includes a probe containing a plurality of sensors arranged to acquire a plurality of data series during a scan stroke, and the probe is mounted on moving equipment that is slidable in a support that is provided with two positioning members for co-operating with recesses neighboring the recess for inspection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.