Method for measuring the noise figure of a device under test with a network analyser
US7804304B2 · kind B2 · utility
1Cited by
4References
9Claims
0Family size
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Key dates
| Filing date | Nov 16, 2006 |
| Grant date | Sep 28, 2010 |
| Priority date | — |
| Expiry date | Aug 15, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring the noise factor (FDUT) of a device under test, which requires exclusively a network analyzer. The noise factor (FDUT) is calculated from the internal noise (NNWA) of the network analyzer determined in a calibration process, the power amplification (GDUT) of the device under test determined by measuring the S-parameters of the device under test, and the measured value (PNOISE) of the noise output (NNWA) applied at a first gate of the device under test without exciting the device under test with a noise signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.