Scanning examination apparatus
US7804642B2 · kind B2 · utility
3Cited by
2References
2Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 16, 2006 |
| Grant date | Sep 28, 2010 |
| Priority date | — |
| Expiry date | Jul 10, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/008
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A scanning examination apparatus 1 is provided, the apparatus including a detachable objective lens 6 or 6′, a scanner 3 for two-dimensionally scanning light F from a specimen 100 focused by the objective lens 6 or 6′, a scanner control device 13 for controlling the operation of the scanner 3, and an optical detector 9 for detecting light scanned by the scanner 3, wherein the scanner control device 13 changes the scanning direction of the light F depending on an image formation mode of the light F at the objective lens 6 or 6′ which is attached.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.