Likelihood metric generation for trellis-based detection and/or decoding
US7805664B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 1, 2007 |
| Grant date | Sep 28, 2010 |
| Priority date | — |
| Expiry date | Nov 27, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M13/41
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Systems and methods for generating likelihood metrics for trellis-based detection and/or decoding are described. In some embodiments, likelihood metrics for a first subset of bit locations in an error pattern (e.g., bit locations that fall within the error event update window) are updated based on a first metric, such as the path metric difference, associated with an alternate path that converges to the same trellis state as the decoded sequence. In some embodiments, likelihood metrics for a second subset of bit locations in the error patterns (e.g., bit locations that do not fall within the error event update window) are updated based on a second metric, such as a predetermined value of zero, a small metric, or the path metric difference for a path that does not converge into the same winning state as the decoded sequence for the particular error update window of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.