Tandem differential mobility spectrometers and mass spectrometer for enhanced analysis
US7812305B2 · kind B2 · utility
13Cited by
3References
26Claims
0Family size
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Key dates
| Filing date | Jun 28, 2007 |
| Grant date | Oct 12, 2010 |
| Priority date | — |
| Expiry date | Mar 15, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/624
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates generally to systems, methods and devices for analyzing samples and, more particularly, to systems using tandem differential mobility spectrometers in combination with a mass analyzer to enhance the analysis process of constituents of a sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.