Microplasma-based sample ionizing device and methods of use thereof
US7812307B2 · kind B2 · utility
10Cited by
9References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 11, 2006 |
| Grant date | Oct 12, 2010 |
| Priority date | — |
| Expiry date | Nov 6, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J37/32366
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Aspects of the invention include sample ionizing devices and methods of use thereof. Embodiments of the sample ionizing devices include a microplasma generation source with a plasma generation region, a sample input port for delivering a sample to the plasma generation region, and a gas flow element configured to flow gas through the microplasma generation source independently of the sample input port. The devices and methods of the invention find use in a variety of different applications, including analyte detection applications.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.