Flat panel X-ray detector with reduced internal scattering for improved attenuation accuracy and dynamic range
US7812314B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 29, 2008 |
| Grant date | Oct 12, 2010 |
| Priority date | — |
| Expiry date | Jan 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T7/00
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
An x-ray detector is disclosed that has had all unnecessary material removed from the x-ray beam path, and all of the remaining material in the beam path made as light and as low in atomic number as possible. The resulting detector is essentially transparent to x-rays and, thus, has greatly reduced internal scatter. The result of this is that x-ray attenuation data measured for the object under examination are much more accurate and have an increased dynamic range. The benefits of this improvement are that beam hardening corrections can be made accurately, that computed tomography reconstructions can be used for quantitative determination of material properties including density and atomic number, and that lower exposures may be possible as a result of the increased dynamic range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.