Fringe projection system and method for a probe using a coherent fiber bundle

US7812968B2 · kind B2 · utility

Assignee

• GE Inspection Technologies, LP · US

Inventors

• Clark Alexander Bendall · Syracuse, US
• Kevin George Harding · Ann Arbor, US
• Guiju Song · Niskayuna, US
• Li Tao · Shanghai, CN
• Ming Jia · Ottawa, CA
• Xinjun Wan · Shanghai, CN

Key dates

• Filing date: Mar 5, 2008
• Grant date: Oct 12, 2010
• Expiry date: Apr 21, 2029

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B23/2415
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A probe is presented that includes a light source, a coherent fiber bundle, and a pattern selector. The pattern selector is disposed between the light source and the proximal end of the coherent fiber bundle. The pattern selector includes at least one patterned zone through which light from the light source passes to project at least one fringe set onto a surface. Each of the at least one fringe sets has a structured-light pattern. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is presented.