Test system having a master/slave JTAG controller
US7818640B1 · kind B1 · utility
13Cited by
106References
5Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 27, 2005 |
| Grant date | Oct 19, 2010 |
| Priority date | — |
| Expiry date | Oct 14, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318555
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test system has a package containing a number of die. There is a JTAG controller for each of the die. There is also master/slave selector input for each of the JTAG controllers. A boundary scan register link connects at least two of the die.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.