Detachable, quick disconnect system for nondestructive testing components
US7819035B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 14, 2008 |
| Grant date | Oct 26, 2010 |
| Priority date | — |
| Expiry date | May 26, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R13/6276
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A connector system for attaching a probe to a probe shaft mating assembly comprising: a probe shaft mating assembly comprising a connector body, a plunger chamber located within the connector body, a spring located within the plunger chamber, a locking ball channel extending through the connector body from the plunger chamber to the outer surface of the connector body, a locking ball located within the locking ball channel, and a plunger located within the plunger chamber adjacent to the spring, wherein the locking ball is in contact with the outer surface of the plunger; a probe comprising a probe body, a probe shaft chamber located within the probe shaft facing end of the probe body, and a locking ball receiver located in the probe body adjacent to the probe shaft chamber; wherein the diameter of the probe shaft chamber is larger than that of the probe shaft mating assembly such that when the plunger and the spring are moved from a first position to a second position, the locking ball moves inwardly towards the plunger chamber and below the outer surface of the connector body allowing the probe facing end of the probe shaft mating assembly to enter the probe shaft chamber, and wh…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.