Patent · US Active

Substrates, systems and methods for analyzing materials

US7820983B2 · kind B2 · utility

176Cited by
60References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 31, 2007
Grant dateOct 26, 2010
Priority date
Expiry dateAug 31, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/7786
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Substrates, systems and methods for analyzing materials that include waveguide arrays disposed upon or within the substrate such that evanescent fields emanating from the waveguides illuminate materials disposed upon or proximal to the surface of the substrate, permitting analysis of such materials. The substrates, systems and methods are used in a variety of analytical operations, including, inter alia, nucleic acid analysis, including hybridization and sequencing analyzes, cellular analyzes and other molecular analyzes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.