System and method for display test
US7821287B2 · kind B2 · utility
1Cited by
19References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 26, 2009 |
| Grant date | Oct 26, 2010 |
| Priority date | — |
| Expiry date | Mar 26, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/3648
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The system for display test includes a driving circuit having integrated circuit (IC) pads on the substrate and the IC pads are electrically connected to the signal lines, respectively. And the first switches are between the first test pads and the IC pads, wherein the number of the first test pads is less than the number of the IC pads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.